IEEE International High Level Design
Validation and Test Workshop 2008

The Hyatt Regency Lake Tahoe Resort, Nevada
November 19-21, 2008
Advance Program (pdf)
WEDNESDAY, November 19
6:00 - 8:00pm Registration
THURSDAY, November 20
7:30am - 5:00pm Registration
7:30 - 8:20am Continental Breakfast
8:20 - 8:30am Welcome Address
Session 1: SOC Verification Methodologies
8:30 - 9:45am
Session Chair: Priyadarsan Patra - Intel
  • Positioning Test-Benches and Test-Programs in Interaction-Oriented System-on-Chip Verification
    Xiaoxi Xu, Cheng-Chew Lim and Michael Liebelt - Univ. of Adelaide, Australia
  • A Method for Hunting Bugs that Occur Due to System Conflicts
    Daniel Geist and Oded Vaida - Intel Corp., Haifa, Israel
  • Applications of Observer and Decorator Design Patterns in SoC Verification
    Farzin Karimi - Metronome, Inc.
9:45 - 10:00am Break
Session 2: Test
10:00 - 10:50am
  • A BIST Scheme for Full Characterization of ADC Parameters in Mixed-Signal SoCs
    Chao Yuan, Yuanfu Zhao and Jun Du - Beijing Microelectronics Technology Institute
  • Test Slice Difference Technique for Low Power Encoding
    Wei-Lin Li, Tsung- Tang Chen, Po-Han Wu and Jiann-Chyi Rau-Tamkang Univ., Taiwan R.O.C.
10:50 - 11:00am Break
Session 3: Panel - Software Practices for Verification/ Testbench Management
11:00am - 12:30pm
Moderator: Shireesh Verma - Conexant Systems, Inc.
Panelists:
  Mark Glassar - Mentor Graphics, Inc.
  Badri Gopalan - Synopsys, Inc.
  Srinath Atluri - Cisco Systems, Inc.
  Sharon Rosenberg - Cadence Design Systems
  Valeria Bertacco - Univ. of Michigan
12:30 - 2:00pm Lunch
Session 4: Formal Verification
2:00 - 3:40pm
Session Chair: Miroslav Velev - Aries Design Automation
  • On Dynamic Switching of Navigation for Semi-Formal Design
    Ankur Parikh and Michael Hsiao - Virginia Tech., USA
  • Multi-Level Bounded Model Checking to Detect Bugs Beyond the Bound
    Tasuku Nishihara, Takeshi Matsumoto and Masahiro Fujita - Univ. of Tokyo
  • Proving and Disproving Assertion Rewrite Rules by Automated Theorem Proving
    Katell Morin-Allory - TIMA, France, Marc Boulé - McGill Univ., Canada
    Dominique Borrione - TIMA, France, Zeljko Zilic - McGill Univ., Canada
  • Janus: A Novel Use of Formal Verification to do Targeted Behavioral Equivalence
    Prakash Math and David Hoenig - Intel Corp., Hillsboro, OR, USA
3:40 - 3:55pm Break
Session 5: Invited Session: On-Chip Instrumentation for Silicon Validation and Debug
3:55 - 5:55pm
Session Chair: Jai Kumar - Sun
  • In-System Silicon Validation Using a Reconfigurable Platform
    Miron Abramovici - DAFCA
  • On-Chip Instrument Application to SoC Analysis
    Neal Stollon - HDL Dynamics, Inc.
Banquet Dinner and Keynote Address:
7:00 - 10:00pm
Keynote Speaker: TBD
FRIDAY, November 21
7:00am - 12:30pm Registration
7:00 - 8:00am Continental Breakfast
Session 6: Functional Testing and Verification
8:00 - 9:40am
Session Chair: Eric Hennenhoefer - Obsidian Software
  • Test and Validation of a Non-Deterministic System - True Random Number Generator
    Kapila Udawatta, Sergey Maidanov, Mehdi Ehsanian and Surya Musunuri - Intel Corp.
  • Functional Testing Approaches for BIFST-able tlm_fifo
    Homa Alemzadeh - Univ. of Tehran, Iran
    Stefano Di Carlo, Alberto Scionti and Paolo Prinetto - Politecnico de Torino, Italy
    Zainalabedin Navabi - Univ. of Tehran, Iran
  • IBM System z Functional and Performance Verification Using X-Gen
    Torsten Schober, Shimon Landa, Bodo Hoppe and Ronny Morad - IBM Corp.
  • Timing Verification of Distributed Network Systems at Higher Levels of Abstraction
    Hassan Hatefi-Ardakani, Amir Masoud Gharehbaghi and Shaahin Hessabi - Sharif Univ. of Technology, Tehran
9:40 - 9:50am Break
Session 7: Simulation
9:50 - 11:05am
Session Chair: Mehdi Mohtashemi - Synopsys
  • Temporal Parallel Gate-level Timing Simulation
    Dusung Kim and Maciej Ciesielski - Univ. of Massachusetts, Amherst
    Kyuho Shim and Seiyang Yang - Pusan National Univ., Korea
  • The Role of Parallel Simulation on Functional Verification
    Giuseppe Di Guglielmo, Franco Fummi - Univ. of Verona, Italy
    Mark Hampton - Certess, France
    Graziano Pravadelli and Francesco Stefanni - Univ. of Ve rona, Italy
  • A HW/SW Co-Simulation Framework for the Verification of Multi-CPU Systems
    Stefano Cordibella, Franco Fummi, Giovanni Perbellini and Davide Quaglia - Univ. of Verona, Italy
11:05 - 11:15am Break
Session 8: Panel - SoC Power Management Implications on Validation and Testing
11:15am - 12:35pm
Moderator: Bhanu Kapoor - Mimasic
Panelists:
  John Goodenough - ARM
  Manuel A d'Abreu - Sandisk Corp.
  Shireesh Ve rma - Conexant Systems, Inc.
  Kaushik Roy - Purdue Univ.
  Shankar Hemmady - Synopsys, Inc.
12:35 - 2:00pm Lunch
Session 9: Special Session: What's So Intelligent about Testbenches?
2:00 - 3:30pm
Organizer: Avi Ziv - IBM Corp.
  • Automatic Test Generation for Coverage Improvement
    Chris Wilson - Nusym Technology, Inc.
  • Capturing Functional Intent in Intelligent Testbenches
    Adnan Hamid - Breker Verification Systems
  • Why Intelligent Verification Needs Functional Qualification
    Joerg Grosse - Certess
3:30 - 3:40pm Break
Session 10: Coverage and Metrics
3:40 - 4:30pm
Session Chair: Rick Zucker - Intel
  • Optimized Coverage-Directed Random Simulation
    Inigo Ugarte and Pablo Sanchez - Univ. of Cantabria, Spain
  • Evaluation of an Efficient Control-Oriented Coverage Metric
    Kiran Ramineni, Shireesh Verma and Ian Harris - Univ. of California, Irvine
4:30 - 4:40pm Break
Session 11: Defect and Fault Models and Test
4:40 - 5:55pm
Session Chair: Seiyang Yang - Pusan National University
  • High-Level Vulnerability over Space and Time to Insidious Soft Errors
    Kenneth Zick and John Hayes - Univ. of Michigan
  • Automating Defects Simulation and Fault Modeling for SRAMs
    Stefano Di Carlo, Paolo Prinetto and Alberto Scionti - Politecnico de Torino, Italy
    Zaid Al-Ars - Delft Univ. of Technology, The Netherlands
  • Injecting Intermittent Faults for the Dependability Validation of Commercial Microcontrollers
    Daniel Gil, Luis J. Saiz, Joaquin Gracia, Juan C. Baraza and Pedro Gil - Univ. Politecnica de Valencia, Spain